| Record ID | harvard_bibliographic_metadata/ab.bib.10.20150123.full.mrc:18796785:779 |
| Source | harvard_bibliographic_metadata |
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LEADER: 00779nam a22002415a 4500
001 010062283-6
005 20070706142125.0
008 060721s2006 mau |||||||eng|d
035 0 $aocn154952666
040 $aMH-Ar$cMH-Ar
100 1 $aXiang, Yong.
245 10 $aPlasticity in Cu thin films :$ban experimental investigation of the effect of microstructure /$cby Yong Xiang
260 $c2005.
300 $axvii, 186 leaves :$bill. ;$c28 cm.
500 $a"October 2005."
502 $aThesis (Ph.D., Division of Engineering and Applied Sciences)--Harvard University, 2006.
504 $aIncludes bibliographical references.
650 0 $aCopper.
650 0 $aPlasticity.
650 0 $aThin films$xMicrostructure.
650 0 $aMicrostructure.
988 $a20060721
906 $0MH