| Record ID | harvard_bibliographic_metadata/ab.bib.10.20150123.full.mrc:652722692:1429 |
| Source | harvard_bibliographic_metadata |
| Download Link | /show-records/harvard_bibliographic_metadata/ab.bib.10.20150123.full.mrc:652722692:1429?format=raw |
LEADER: 01429cam a2200433Ia 4500
001 010879793-7
005 20110712022058.0
008 070309s2007 gw a b 001 0 eng d
016 7 $a97689291X$2GyFmDB
020 $a9783540302773 (hd.bd.)
020 $a3540302778 (hd.bd.)
035 0 $aocm85842084
040 $aOHX$cOHX$dBTCTA$dBAKER$dUAT$dYDXCP
050 4 $aQC451$b.V47 2007
072 7 $aQC$2lcco
072 7 $aQD$2lcco
100 1 $aVerma, H. R.
245 10 $aAtomic and nuclear analytical methods :$bXRF, Mössbauer, XPS, NAA and ion-beam spectroscopic techniques /$cH.R. Verma.
260 $aBerlin ;$aNew York :$bSpringer,$cc2007.
300 $axiv, 375 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references (p. [341]-364) and index.
650 0 $aSpectrum analysis.
650 0 $aParticles (Nuclear physics)
650 0 $aPhysics
650 0 $aAnalytical biochemistry
650 0 $aWeights and measures
650 0 $aPlasma (Ionized gases)
650 0 $aCondensed matter
650 0 $aElectromagnetism
650 0 $aSurfaces (Physics)
650 14 $aPhysics
650 24 $aMeasurement Science, Instrumentation
650 24 $aAnalytical Chemistry
650 24 $aCharacterization and Evaluation of Materials
650 24 $aAtoms, Molecules, Clusters and Plasmas
650 24 $aCondensed Matter
650 24 $aElectromagnetism, Optics and Lasers
988 $a20070820
906 $0OCLC