MARC Record from harvard_bibliographic_metadata

LEADER: 02745cam a22003014a 4500
001 011756612-8
005 20081201152521.0
008 080320s2009 fluaf bf 001 0 eng
010 $a 2008013026
020 $a9781420045543
020 $a1420045547
035 0 $aocn213765926
040 $aDLC$cDLC$dBAKER$dBTCTA$dYDXCP$dOCLNG$dC#P$dBWX$dCDX
050 00 $aQC372.2.D4$bH36 2009
082 00 $a681/.4$222
245 00 $aHandbook of charged particle optics /$cedited by Jon Orloff.
250 $a2nd ed.
260 $aBoca Raton :$bCRC Press,$cc2009.
300 $axi, 665 p., [7] p. of plates :$bill. (some col.) ;$c27 cm.
504 $aIncludes bibliographical references and index.
505 0 $aReview of ZrO/W Schottky cathode / Lyn W. Swanson, Gregory A. Schwind -- Liquid metal ion sources / Richard G. Forbes, (the late) Graeme L.R. Mair -- Gas field ionization sources / Richard G. Forbes -- Magnetic lenses for electron microscopy / Katsushige Tsuno -- Electrostatic lenses / Bohumila Lencová -- Aberrations / Peter W. Hawkes -- Space charge and statistical coulomb effects / Pieter Kruit, Guus H. Jansen -- Resolution / Mitsugu Sato -- The scanning electron microscope / András E. Vladár, Michael T. Postek -- The scanning transmission electron microscope / Albert V. Crewe; updated by Peter D. Nellist -- Focused ion beams / M. Utlaut -- Aberration correction in electron microscopy / Ondrej L. Krivanek, Niklas Dellby, Matthew F. Murfitt -- Appendix: Computational resources for electron microscopy / J. Orloff; with valuable information from Peter W. Hawkes, Bohumila Lencová.
520 $a"With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution-focused probe instruments." "The book's unique approach covers both the theoretical and practical knowledge of high-resolution probe-forming instruments. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field's cutting-edge technologies with added insight into how they work." "Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high-resolution probe instrumentation." --Book Jacket.
650 0 $aOptical instruments$xDesign and construction$vHandbooks, manuals, etc.
650 0 $aElectron optics$vHandbooks, manuals, etc.
655 7 $aHandbooks, manuals, etc.$2fast
700 1 $aOrloff, Jon.
988 $a20081201
906 $0DLC