| Record ID | harvard_bibliographic_metadata/ab.bib.11.20150123.full.mrc:697689121:931 |
| Source | harvard_bibliographic_metadata |
| Download Link | /show-records/harvard_bibliographic_metadata/ab.bib.11.20150123.full.mrc:697689121:931?format=raw |
LEADER: 00931cam a22002898a 4500
001 011791475-4
005 20081218123435.0
008 080903s2008 gw a b 001 0 eng
015 $aGBA8A8195$2bnb
016 7 $a014750128$2Uk
020 $a9783540850380 (hbk.)
020 $a3540850384 (hbk.)
035 0 $aocn248994138
040 $aUKM$cUKM$dYDXCP
050 00 $aTA417.23$b.A655 2009b
082 04 $a620.1/1299$222
245 00 $aApplied scanning probe methods XII :$bcharacterization /$cBharat Bhushan, Harald Fuchs [eds.].
260 $aBerlin ;$aLondon :$bSpringer,$cc2009.
300 $alv, 224 p. :$bill. (some col.) ;$c24 cm.
440 0 $aNanoscience and technology
650 0 $aScanning probe microscopy.
650 0 $aScanning probe microscopy$xIndustrial applications.
650 0 $aMaterials$xMicroscopy.
700 1 $aBhushan, Bharat,$d1949-
700 1 $aFuchs, H.$q(Harald)
988 $a20081218
906 $0OCLC