Record ID | harvard_bibliographic_metadata/ab.bib.12.20150123.full.mrc:354321111:606 |
Source | harvard_bibliographic_metadata |
Download Link | /show-records/harvard_bibliographic_metadata/ab.bib.12.20150123.full.mrc:354321111:606?format=raw |
LEADER: 00606nam a22001695a 4500
001 012510766-8
005 20100617150713.0
008 100617s1968 xx |||||||eng|d
035 0 $aocn654492212
100 1 $aEchlin, Patrick.
245 14 $aThe use of the scanning reflection electron microscope in the study of plant and microbial material /$cby Patrick Echlin.
260 $c1968.
300 $ap. 407-418 :$bill. ;$c26 cm.
500 $aJournal of the Royal Microscopical Society, v. 88, pt. 3, June 1968, p. 407-418.
504 $aIncludes bibliographical references (p. 416-418).
988 $a20100617
906 $0MH