| Record ID | harvard_bibliographic_metadata/ab.bib.12.20150123.full.mrc:703066321:1134 |
| Source | harvard_bibliographic_metadata |
| Download Link | /show-records/harvard_bibliographic_metadata/ab.bib.12.20150123.full.mrc:703066321:1134?format=raw |
LEADER: 01134nam a22003375a 4500
001 012822824-5
005 20110805193224.0
008 100301s2009 xx |0| 0 eng d
020 $a9781848820593 (ebk.)
020 $a9781848820586
035 $a(Springer)9781848820586
040 $aSpringer
100 1 $aSeebauer, Edmund G.
245 10 $aCharged Semiconductor Defects :$bStructure, Thermodynamics and Diffusion /$cby Edmund G. Seebauer, Meredith C. Kratzer.
260 $aLondon :$bSpringer London,$c2009.
300 $bv.: digital
650 24 $aEngineering Thermodynamics, Transport Phenomena.
650 24 $aElectronics and Microelectronics, Instrumentation.
650 24 $aContinuum Mechanics and Mechanics of Materials.
650 24 $aOptical and Electronic Materials.
650 24 $aSolid State Physics and Spectroscopy.
650 10 $aPhysics.
650 0 $aOptical materials.
650 0 $aElectronics.
650 0 $aMaterials.
650 0 $aPhysics.
650 0 $aParticles (Nuclear physics)
700 1 $aKratzer, Meredith C.
830 0 $aEngineering materials and processes.
988 $a20110712
906 $0VEN