| Record ID | harvard_bibliographic_metadata/ab.bib.12.20150123.full.mrc:703269955:1029 |
| Source | harvard_bibliographic_metadata |
| Download Link | /show-records/harvard_bibliographic_metadata/ab.bib.12.20150123.full.mrc:703269955:1029?format=raw |
LEADER: 01029nam a22003015a 4500
001 012823059-2
005 20110805193422.0
008 100729s2005 xx |0| 0 eng d
020 $a9783540447016 (ebk.)
020 $a9783540232490
035 $a(Springer)9783540232490
040 $aSpringer
100 1 $aSchubert, Mathias.
245 10 $aInfrared Ellipsometry on Semiconductor Layer Structures :$bPhonons, Plasmons, and Polaritons /$cby Mathias Schubert.
260 $aBerlin, Heidelberg :$bSpringer-Verlag Berlin/Heidelberg,$c2005.
300 $bv.: digital
650 24 $aPhysics and Applied Physics in Engineering.
650 24 $aApplied Optics, Optoelectronics, Optical Devices.
650 24 $aOptical and Electronic Materials.
650 24 $aSurfaces and Interfaces, Thin Films.
650 10 $aChemistry.
650 0 $aOptical materials.
650 0 $aPhysical optics.
650 0 $aChemistry.
650 0 $aSurfaces (Physics)
830 0 $aSpringer tracts in modern physics ;$v209.
988 $a20110712
906 $0VEN