| Record ID | harvard_bibliographic_metadata/ab.bib.12.20150123.full.mrc:709091521:1207 |
| Source | harvard_bibliographic_metadata |
| Download Link | /show-records/harvard_bibliographic_metadata/ab.bib.12.20150123.full.mrc:709091521:1207?format=raw |
LEADER: 01207nam a22003735a 4500
001 012827781-5
005 20110805195355.0
008 110208s2011 xx |0| 0 eng d
020 $a9783642158131 (ebk.)
020 $a9783642158124
035 $a(Springer)9783642158124
040 $aSpringer
100 1 $aFerraro, Pietro.
245 10 $aCoherent Light Microscopy :$bImaging and Quantitative Phase Analysis /$cedited by Pietro Ferraro, Adam Wax, Zeev Zalevsky.
260 $aBerlin, Heidelberg :$bSpringer-Verlag Berlin Heidelberg,$c2011.
300 $bv.: digital
650 24 $aImaging / Radiology.
650 20 $aNanotechnology.
650 20 $aBiomedical materials.
650 24 $aCharacterization and Evaluation of Materials.
650 24 $aBiological Microscopy.
650 24 $aOptics, Optoelectronics, Plasmonics and Optical Devices.
650 10 $aPhysics.
650 0 $aNanotechnology.
650 0 $aBiomedical materials.
650 0 $aMicroscopy.
650 0 $aRadiology, Medical.
650 0 $aPhysics.
650 0 $aSurfaces (Physics)
700 1 $aWax, Adam.
700 1 $aZalevsky, Zeev.
830 0 $aSpringer series in surface sciences ;$v46.
988 $a20110715
906 $0VEN