| Record ID | harvard_bibliographic_metadata/ab.bib.12.20150123.full.mrc:709123739:861 |
| Source | harvard_bibliographic_metadata |
| Download Link | /show-records/harvard_bibliographic_metadata/ab.bib.12.20150123.full.mrc:709123739:861?format=raw |
LEADER: 00861nam a22002655a 4500
001 012827821-8
005 20110805195415.0
008 110330s2011 xx |0| 0 eng d
020 $a9783642120121 (ebk.)
020 $a9783642120114
035 $a(Springer)9783642120114
040 $aSpringer
100 1 $aLeach, Richard.
245 10 $aOptical Measurement of Surface Topography /$cedited by Richard Leach.
260 $aBerlin, Heidelberg :$bSpringer-Verlag Berlin Heidelberg,$c2011.
300 $bv.: digital
650 24 $aSurfaces and Interfaces, Thin Films.
650 24 $aMeasurement Science and Instrumentation.
650 24 $aMicrowaves, RF and Optical Engineering.
650 24 $aCharacterization and Evaluation of Materials.
650 10 $aMaterials science.
650 0 $aMicrowaves.
650 0 $aSurfaces (Physics)
988 $a20110715
906 $0VEN