MARC Record from harvard_bibliographic_metadata

LEADER: 02820cam a2200481 a 4500
001 013037030-4
005 20120109102033.0
008 050510s2005 enkaf b 001 0 eng
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016 7 $a013200843$2Uk
020 $a052184875X
020 $a9780521848756
020 $a9780511610561 (ebook)
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037 $a36777$bTVG
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050 00 $aQE440$b.R43 2005
082 04 $a552.8$222
082 04 $a502.825024553$222
100 1 $aReed, S. J. B.
245 10 $aElectron microprobe analysis and scanning electron microscopy in geology /$cS.J.B. Reed.
250 $a2nd ed.
260 $aCambridge :$bCambridge University Press,$cc2005.
300 $axiii, 189 p., [7] p. of plates :$bill. (some col.) ;$c26 cm.
500 $aPrevious ed.: 1996.
504 $aIncludes bibliographical references and index.
505 0 $a1. Introduction -- 2. Electron-specimen interactions -- 3. Instrumentation -- 4. Scanning electron microscopy -- 5. X-ray spectrometers -- 6. Element mapping -- 7. X-ray analysis (1) -- 8. X-ray analysis (2) -- 9. Sample preparation.
520 1 $a"Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories."--Cover.
650 0 $aPetrofabric analysis.
650 0 $aElectron probe microanalysis.
650 0 $aScanning electron microscopy.
650 6 $aGéologie$xÉchantillons$xAnalyse.
650 6 $aAnalyse par microsonde.
650 6 $aMicroscopie électronique à balayage.
650 04 $aPetrofabrik analiz.
650 04 $aElektro mikroprob analiz.
650 04 $aTarayıcı elektron mikroskopisi.
899 $a415_565300
988 $a20120109
049 $aCLSL
906 $0OCLC