| Record ID | harvard_bibliographic_metadata/ab.bib.13.20150123.full.mrc:579799066:1204 |
| Source | harvard_bibliographic_metadata |
| Download Link | /show-records/harvard_bibliographic_metadata/ab.bib.13.20150123.full.mrc:579799066:1204?format=raw |
LEADER: 01204nam a22003615a 4500
001 013530539-X
005 20130208190909.0
008 120917s2013 ne | s ||0| 0|eng d
020 $a9789400747623
020 $a9789400747623
020 $a9789400747616
024 7 $a10.1007/978-94-007-4762-3$2doi
035 $a(Springer)9789400747623
040 $aSpringer
050 4 $aQC770-798
072 7 $aPHP$2bicssc
072 7 $aSCI051000$2bisacsh
082 04 $a539.7$223
100 1 $aYoshida, Yutaka.
245 10 $aICAME 2011 :$bProceedings of the 31st International Conference on the Applications of the Mössbauer Effect (ICAME 2011) held in Tokyo, Japan, 25-30 September 2011 /$cedited by Yutaka Yoshida.
260 $aDordrecht :$bSpringer Netherlands :$bImprint: Springer,$c2013.
300 $bdigital.
650 10 $aPhysics.
650 0 $aSurfaces (Physics)
650 0 $aSpectrum analysis.
650 0 $aPhysics.
650 24 $aParticle and Nuclear Physics.
650 24 $aSpectroscopy and Microscopy.
650 24 $aSpectroscopy/Spectrometry.
650 24 $aCharacterization and Evaluation of Materials.
776 08 $iPrinted edition:$z9789400747616
988 $a20130105
906 $0VEN