MARC Record from harvard_bibliographic_metadata

LEADER: 03099nam a22003735a 4500
001 013832830-7
005 20131206194849.0
008 100715s2002 gw | s ||0| 0|eng d
020 $a9783540460084
020 $a9783540460084
020 $a9783540434436
024 7 $a10.1007/3-540-46008-X$2doi
035 $a(Springer)9783540460084
040 $aSpringer
100 1 $aWaseda, Yoshio,$eauthor.
245 10 $aAnomalous X-Ray Scattering for Material Characterization :$bAtomic-Scale Structure Determination /$cby Yoshio Waseda.
264 1 $aBerlin, Heidelberg :$bSpringer Berlin Heidelberg,$c2002.
300 $aXIII, 214 p.$bonline resource.
336 $atext$btxt$2rdacontent
337 $acomputer$bc$2rdamedia
338 $aonline resource$bcr$2rdacarrier
347 $atext file$bPDF$2rda
490 1 $aSpringer Tracts in Modern Physics,$x0081-3869 ;$v179
505 0 $a1. Structural Characterization of Crystalline and Non-crystalline Material -- 2. Experimental Determination of Partial and Environmental Structure Functions in Non-crystalline Systems -- 3. Nature of Anomalous X-ray Scattering and Its Application to Structural Analysis of Crystalline and Non-crystalline Systems -- 4. Experimental Determination of the Anomalous Dispersion Factors of X-rays -- 5. In-House Equipment and Synchrotron Radiation Facilities for Anomalous X-ray Scattering -- 6. Selected Examples of Structural Determination for Crystalline Materials Using the AXS Method -- 7. Selected Examples of Structural Determination for Non-crystalline Materials Using the AXS Method -- 8. Anomalous Small-Angle X-ray Scattering -- 9. Anomalous Grazing-Incidence X-ray Reflection -- 10. Merits of Anomalous X-ray Scattering and Its Future Prospects -- Appendix -- References -- Index.
520 $aThe evolution of our understanding of most properties of new functional materials is related to our knowledge of their atomic-scale structure. To further this, several X-ray and neutron techniques are employed. The anomalous X-ray scattering (AXS) method, exploiting the so-called anomalous dispersion effect near the absorption edge of the constituent element, is one of the most powerful methods for determining the accurate partial structure functions of individual pairs of constituents or the environmental functions around specific elements in multicomponent systems. AXS is useful for both crystalline and non-crystalline systems, for studies of surface and bulk materials. This book is the first on this new method of structural characterization. It describes the basics and application principles, and also treats the specifics of application to liquid alloys, supercooled liquids, solutions, metallic glasses, oxide glasses, superconducting ionic glasses etc.
650 10 $aChemistry.
650 0 $aSurfaces (Physics)
650 0 $aChemistry.
650 24 $aSurfaces and Interfaces, Thin Films.
650 24 $aCharacterization and Evaluation of Materials.
776 08 $iPrinted edition:$z9783540434436
830 0 $aSpringer Tracts in Modern Physics ;$v179.
988 $a20131114
906 $0VEN