MARC Record from harvard_bibliographic_metadata

LEADER: 03165nam a22004575a 4500
001 014131540-7
005 20140905184831.0
008 140710s2014 xxu| s ||0| 0|eng d
020 $a9781493909353
020 $a9781493909353
020 $a9781493909346
024 7 $a10.1007/978-1-4939-0935-3$2doi
035 $a(Springer)9781493909353
040 $aSpringer
050 4 $aTA404.6
072 7 $aTGMT$2bicssc
072 7 $aTEC021000$2bisacsh
082 04 $a620.11$223
100 1 $aBauer, Ernst,$eauthor.
245 10 $aSurface Microscopy with Low Energy Electrons /$cby Ernst Bauer.
264 1 $aNew York, NY :$bSpringer New York :$bImprint: Springer,$c2014.
300 $aXIX, 496 p. 216 illus., 71 illus. in color.$bonline resource.
336 $atext$btxt$2rdacontent
337 $acomputer$bc$2rdamedia
338 $aonline resource$bcr$2rdacarrier
347 $atext file$bPDF$2rda
505 0 $aChapter 1. Introduction -- Chapter 2. Basic Interactions -- Chapter 3. Instrumentation -- Chapter 4. Theory of image formation -- Chapter 5. Applications in surface science -- Chapter 6. Applications in other fields -- Chapter 7. Magnetic imaging -- Chapter 8. Other surface imaging methods with electrons.
520 $aThis book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes. Provides a unified description of full-field, low energy electron microscopies Presents the basic theory and experiment of low energy emission and reflection Compares the possibilities and limitations of the various imaging methods Describes multi-method studies Contains an extensive list of references for easy access to the original literature
650 20 $aSolid state physics.
650 10 $aMaterials science.
650 0 $aSurfaces (Physics)
650 0 $aSpectrum analysis.
650 0 $aMicroscopy.
650 24 $aCharacterization and Evaluation of Materials.
650 24 $aSpectroscopy/Spectrometry.
650 24 $aSpectroscopy and Microscopy.
650 24 $aSurfaces and Interfaces, Thin Films.
650 24 $aBiological Microscopy.
776 08 $iPrinted edition:$z9781493909346
988 $a20140802
906 $0VEN