| Record ID | harvard_bibliographic_metadata/ab.bib.14.20150123.full.mrc:263938373:706 |
| Source | harvard_bibliographic_metadata |
| Download Link | /show-records/harvard_bibliographic_metadata/ab.bib.14.20150123.full.mrc:263938373:706?format=raw |
LEADER: 00706nam a2200217Ka 4500
001 014197665-9
005 20141001161527.0
006 m o d
008 140402s2006 ch om 000 0 chi d
035 $a(Crl)b28727137
035 0 $aocn875431204
040 $aCRL$cCRL$dMH
100 1 $aZhong, Hui.
245 10 $aInverse analysis of dielectric properties of layered structures and the applications in engineering /$cHui Zhong.
260 $c2006.
300 $a1 online resource.
502 $aThesis (doctoral)--Dalian University of Technology, 2006.
546 $aIn Chinese; Abstract in English.
588 $aDescription based on online resource; title from PDF.
988 $a20141001
906 $0OCLC