| Record ID | ia:acceleratedtesti0000nels_c6i4 |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/acceleratedtesti0000nels_c6i4/acceleratedtesti0000nels_c6i4_marc.xml |
| Download MARC binary | https://www.archive.org/download/acceleratedtesti0000nels_c6i4/acceleratedtesti0000nels_c6i4_meta.mrc |
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008 041221s2004 njua b 001 0 eng d
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035 $a(OCoLC)57306142$z(OCoLC)1110323884
050 14 $aQA276$b.N45 2004
082 4 $a519.5 UKW
100 1 $aNelson, Wayne,$d1936-
245 10 $aAccelerated testing :$bstatistical models, test plans and data analyses /$cWayne Nelson.
250 $aPbk. ed.
260 $aHoboken, N.J. :$bWiley-Interscience,$c©2004.
300 $axiv, 601 pages :$billustrations ;$c25 cm.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
338 $avolume$bnc$2rdacarrier
490 1 $aWiley series in probability and statistics
490 1 $aWiley-Interscience paperback series
490 1 $aWiley classics library
504 $aIncludes bibliographical references (pages 561-577) and index.
650 0 $aFailure time data analysis.
650 0 $aReliability (Engineering)$xStatistical methods.
650 0 $aAccelerated life testing$xStatistical methods.
650 6 $aAnalyse des temps entre défaillances.
650 6 $aEssais accélérés (Technologie)$xMéthodes statistiques.
650 7 $aAccelerated life testing$xStatistical methods.$2fast$0(OCoLC)fst00795213
650 7 $aFailure time data analysis.$2fast$0(OCoLC)fst00919850
650 7 $aReliability (Engineering)$xStatistical methods.$2fast$0(OCoLC)fst01093658
650 7 $aStatistische Qualitätskontrolle$2gnd
650 7 $aBeschleunigte Prüfung$2gnd
650 7 $aLebensdauer$2gnd
650 7 $aStatistische Analyse$2gnd
650 7 $aZuverlässigkeitstheorie$2gnd
650 7 $aTeoria da confiabilidade.$2larpcal
650 7 $aEstatística aplicada.$2larpcal
653 $aEngineering$aMathematical models
830 0 $aWiley series in probability and statistics.
830 0 $aWiley-Interscience paperback series.
830 0 $aWiley classics library.
856 41 $uhttp://lib.myilibrary.com/browse/open.asp?id=230782&entityid=https://idp.brunel.ac.uk/entity
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948 $hNO HOLDINGS IN IME - 67 OTHER HOLDINGS