| Record ID | ia:advancesinelectr0000unse_n1f2 |
| Source | Internet Archive |
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003 OCoLC
005 20211110065211.0
008 081103s1978 nyua ob 001 0 eng d
006 m o d
007 cr cnu---unuuu
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019 $a646754904
020 $a9780080577128$q(electronic bk.)
020 $a0080577121$q(electronic bk.)
020 $a0120146479$q(electronic bk.)
020 $a9780120146475$q(electronic bk.)
035 $a(OCoLC)268676281$z(OCoLC)646754904
050 4 $aTK7815$b.A38eb vol. 47
072 7 $aTEC$x008070$2bisacsh
072 7 $aTEC$x008060$2bisacsh
082 04 $a621.381$222
245 00 $aAdvances in electronics and electron physics.$nVolume 47 /$cedited by L. Marton.
260 $aNew York :$bAcademic Press,$c1978.
300 $a1 online resource (xi, 346 pages) :$billustrations.
336 $atext$btxt$2rdacontent
337 $acomputer$bc$2rdamedia
338 $aonline resource$bcr$2rdacarrier
490 0 $aAdvances in electronics and electron physics ;$vv. 47
504 $aIncludes bibliographical references and indexes.
505 0 $aIon beam technology applied to electron microscopy / J. Franks -- Microprocessors and their use in physics / Anthony J. Davies -- Wire antennas / P.A. Ramsdale -- Characterization of the MOSFET operating in weak inversion / Paul A. Muls, Gilbert J. Declerck, and Roger J. Van Overstraeten -- Modeling of the transient response of the MIS capacitor / T.W. Collins [and others].
588 0 $aPrint version record.
650 0 $aElectronics.
650 0 $aElectrons.
650 0 $aElectron microscopy.
650 0 $aMicroprocessors.
650 7 $aTECHNOLOGY & ENGINEERING$xElectronics$xMicroelectronics.$2bisacsh
650 7 $aTECHNOLOGY & ENGINEERING$xElectronics$xDigital.$2bisacsh
650 7 $aElectron microscopy.$2fast$0(OCoLC)fst00906682
650 7 $aElectronics.$2fast$0(OCoLC)fst00907538
650 7 $aElectrons.$2fast$0(OCoLC)fst00907642
650 7 $aMicroprocessors.$2fast$0(OCoLC)fst01020008
655 4 $aElectronic books.
700 1 $aMarton, L.$q(Ladislaus),$d1901-
776 08 $iPrint version:$tAdvances in electronics and electron physics. Volume 47.$dNew York : Academic Press, 1978$z0120146479$z9780120146475$w(DLC) 49007504$w(OCoLC)55140561
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