| Record ID | ia:automatedinspect0849unse |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/automatedinspect0849unse/automatedinspect0849unse_marc.xml |
| Download MARC binary | https://www.archive.org/download/automatedinspect0849unse/automatedinspect0849unse_meta.mrc |
LEADER: 01410nam a2200265 a 4500
001 87063195
003 DLC
005 19881031144843.1
008 871103s1988 waua b 10100 eng
010 $a 87063195
020 $a0892528842
050 0 $aTS156.2$b.A889 1988
082 0 $a681/.4$219
245 00 $aAutomated inspection and high speed vision architectures :$b3-4 November, 1987, Cambridge, Massachusetts /$cMichael J.W. Chen, Rolf-Juergen Ahlers, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, in association with IEEE Industrial Electronics Society, Society of Instrument and Control Engineers of Japan ; cooperating organizations, Center for Optical Data Processing/Carnegie Mellon University ... [et al.].
260 0 $aBellingham, Wash., USA :$bSPIE--the International Society for Optical Engineering,$cc1988.
300 $avi, 274 p. :$bill. ;$c28 cm.
440 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 849
504 $aIncludes bibliographies and index.
650 0 $aQuality control$xOptical methods$xAutomation$xCongresses.
650 0 $aComputer vision$xCongresses.
700 10 $aChen, Michael J. W.
700 10 $aAhlers, R.-J.$q(Rolf-Jürgen)
710 20 $aSociety of Photo-optical Instrumentation Engineers.
710 20 $aIEEE Industrial Electronics Society.
710 20 $aKeisoku Jidō Seigyo Gakkai (Japan)