| Record ID | ia:characterization0000inte |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/characterization0000inte/characterization0000inte_marc.xml |
| Download MARC binary | https://www.archive.org/download/characterization0000inte/characterization0000inte_meta.mrc |
LEADER: 01316cam a22002774a 4500
001 2005271285
003 DLC
005 20050321153112.0
008 050301s2005 ohua b 101 0 eng
010 $a 2005271285
020 $a1574981706
040 $aDLC$cDLC
042 $apcc
050 00 $aQC173.4.I57$bI585 2003
111 2 $aInternational Conference on the Characterization and Control of Interfaces for High Quality Advanced Materials$d(2003 :$cKurashiki-shi, Japan)
245 10 $aCharacterization & control of interfaces for high quality advanced materials :$bproceedings of the International Conference on the Characterization and Control of Interfaces for High Quality Advanced Materials (ICCCI 2003), Kurashiki, Japan, 2003 /$cedited by Kevin Ewsuk ... [et al.].
246 14 $aCharacterization and control of interfaces for high quality advanced materials
260 $aWesterville, Ohio :$bAmerican Ceramic Society,$cc2005.
300 $axiii, 486 p. :$bill. ;$c24 cm.
440 0 $aCeramic transactions,$x1042-1122 ;$vv. 146
504 $aIncludes bibliographical references and index.
650 0 $aInterfaces (Physical sciences)$vCongresses.
650 0 $aNanoparticles$vCongresses.
650 0 $aSurfaces (Technology)$vCongresses.
650 0 $aCeramic materials$vCongresses.
700 1 $aEwsuk, Kevin.