| Record ID | ia:defectspropertie0000unse |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/defectspropertie0000unse/defectspropertie0000unse_marc.xml |
| Download MARC binary | https://www.archive.org/download/defectspropertie0000unse/defectspropertie0000unse_meta.mrc |
LEADER: 01329cam a2200277 a 4500
001 86021992
003 DLC
005 19911025173340.0
008 860818s1987 ja a b 10100 eng
010 $a 86021992 //r912
020 $a9027723524 (D. Reidel)
040 $aDLC$cDLC$dDLC
050 00 $aQC611.6.D4$bD4184 1987
082 00 $a621.3815/2$219
245 00 $aDefects and properties of semiconductors :$bdefect engineering /$cedited by J. Chikawa, K. Sumino, and K. Wada.
260 0 $aTokyo :$bKTK Scientific ;$aDordrecht ;$aBoston :$bD. Reidel ;$aNorwell, MA, U.S.A. :$bDistributed in the U.S.A. and Canada by Kluwer Academic,$cc1987.
300 $avi, 261 p. :$bill. ;$c24 cm.
440 0 $aAdvances in solid state technology ;$v3
504 $aIncludes bibliographies and index.
500 $a"Papers presented at the Symposium on "Defects and Qualities of Semiconductors" which was held in Tokyo on May 17-18, 1984 under the sponsorship of the Society of Non-Traditional Technology"--Pref.
650 0 $aSemiconductors$xDefects$xCongresses.
700 10 $aChikawa, J.$q(Junichi),$d1930-
700 10 $aSumino, K.$q(Kōji),$d1931-
700 10 $aWada, K.$q(Kazumi),$d1950-
711 20 $aSymposium on "Defects and Qualities of Semiconductors"$d(1984 :$cTokyo, Japan)
710 20 $aSociety of Non-Traditional Technology (Japan)