| Record ID | ia:electricalcharac0000look |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/electricalcharac0000look/electricalcharac0000look_marc.xml |
| Download MARC binary | https://www.archive.org/download/electricalcharac0000look/electricalcharac0000look_meta.mrc |
LEADER: 00790cam a2200229 a 4500
001 88020730
003 DLC
005 19920826105528.9
008 880718s1989 enka b 00110 eng
010 $a 88020730
020 $a0471917028 :$c$51.50
040 $aDLC$cDLC$dDLC
050 00 $aTK7871.15.G3$bL66 1989
082 00 $a621.3815/2$219
100 10 $aLook, D. C.$q(David C.),$d1938-
245 10 $aElectrical characterization of GaAs materials and devices /$cDavid C. Look.
260 0 $aChichester ;$aNew York :$bWiley,$cc1989.
300 $ax, 280 p. :$bill. ;$c24 cm.
440 0 $aDesign and measurement in electronic engineering
504 $aIncludes bibliographical references (p. 261-275) and index.
650 0 $aGallium arsenide semiconductors$xTesting.
650 0 $aMagnetoresistance.