MARC record from Internet Archive

LEADER: 02273cam 2200565 i 4500
001 ocm06043433
003 OCoLC
005 20191223073036.0
008 800207s1981 nyuaf b 001 0 eng
010 $a 80607032
040 $aDLC$beng$cDLC$dOCLCQ$dWPG$dNIALS$dDEBBG$dOCL$dOCLCF$dOCLCQ$dOCLCO$dOKX$dXFF$dCNO$dCSO$dOCLCQ$dOCLCO$dUKBTH
066 $cZsym
020 $a0442232861
020 $a9780442232863
035 $a(OCoLC)6043433
050 00 $aQD98.E4$bH44
080 0 $a537.533
082 00 $a543/.0812
084 $aUH 6300$2rvk
084 $aUQ 5600$2rvk
084 $aCHE 264f$2stub
100 1 $aHeinrich, Kurt F. J.
245 10 $aElectron beam x-ray microanalysis /$cKurt F.J. Heinrich.
260 $aNew York :$bVan Nostrand Reinhold Co.,$c℗♭1981.
300 $axxiii, 578 pages, 4 unnumbered leaves of plates :$billustrations ;$c24 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
338 $avolume$bnc$2rdacarrier
504 $aIncludes bibliographical references and indexes.
650 0 $aElectron probe microanalysis.
650 0 $aX-ray spectroscopy.
650 7 $aElectron probe microanalysis.$2fast$0(OCoLC)fst00906704
650 7 $aX-ray spectroscopy.$2fast$0(OCoLC)fst01181847
650 7 $aElektronenoptik$2gnd
650 7 $aMikroanalyse$2gnd
650 7 $aRo ntgenspektroskopie$2gnd
650 7 $aRo ntgenstrahlung$2gnd
776 08 $iOnline version:$aHeinrich, Kurt F.J.$tElectron beam x-ray microanalysis.$dNew York : Van Nostrand Reinhold Co., ℗♭1981$w(OCoLC)621623629
856 41 $3Table of contents$uhttp://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=001488729&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
856 41 $3Table of contents$uhttp://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=001488729&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
880 4 $6264-00/Zsym$c��1981
029 1 $aAU@$b000001673199
029 1 $aDEBBG$bBV002265476
029 1 $aGBVCP$b014228661
029 1 $aHEBIS$b055535070
029 1 $aNLGGC$b800685997
029 1 $aNZ1$b3393928
029 1 $aZWZ$b019643179
994 $aZ0$bP4A
948 $hNO HOLDINGS IN P4A - 323 OTHER HOLDINGS