| Record ID | ia:electronionmicro0000murr |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/electronionmicro0000murr/electronionmicro0000murr_marc.xml |
| Download MARC binary | https://www.archive.org/download/electronionmicro0000murr/electronionmicro0000murr_meta.mrc |
LEADER: 02929cam a2200685Ma 4500
001 15669992
005 20220521230602.0
006 m o d
007 cr cn|||||||||
008 010827s1991 nyua ob 001 0 eng d
035 $a(OCoLC)ocm48139870
035 $a(NNC)15669992
040 $aN$T$beng$epn$cN$T$dOCLCQ$dYDXCP$dOCLCQ$dOCLCF$dOCLCQ$dOCLCO$dOCLCQ$dOCLCA$dYDX$dUKAHL$dSFB$dOCLCO
019 $a907030479$a1260362094
020 $a0585378886$q(electronic bk.)
020 $a9780585378886$q(electronic bk.)
020 $z0824715535
020 $z9780824715533
020 $a9781315214405$q(electronic bk.)
020 $a1315214407$q(electronic bk.)
020 $z0824785568
020 $z9780824785567
035 $a(OCoLC)48139870$z(OCoLC)907030479$z(OCoLC)1260362094
050 4 $aQH212.E4$bM87 1991eb
072 7 $aSCI$x023000$2bisacsh
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084 $aUH 6300$2rvk
084 $a35.25$2bcl
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084 $a35.50$2bcl
049 $aZCUA
100 1 $aMurr, Lawrence Eugene.
245 10 $aElectron and ion microscopy and microanalysis :$bprinciples and applications /$cLawrence E. Murr.
250 $a2nd ed., rev. and expanded.
260 $aNew York :$bM. Dekker,$c©1991.
300 $a1 online resource (xiv, 837 pages) :$billustrations.
336 $atext$btxt$2rdacontent
337 $acomputer$bc$2rdamedia
338 $aonline resource$bcr$2rdacarrier
490 1 $aOptical engineering ;$v29
504 $aIncludes bibliographical references and indexes.
588 0 $aPrint version record.
520 $aThe publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr.
650 0 $aElectron microscopy.
650 0 $aField ion microscopy.
650 0 $aMicroprobe analysis.
650 2 $aMicroscopy, Electron
650 6 $aMicroscopie électronique.
650 6 $aMicroscopie ionique à champ.
650 6 $aAnalyse par microsonde.
650 7 $aelectron microscopy.$2aat
650 7 $aSCIENCE$xElectron Microscopes & Microscopy.$2bisacsh
650 7 $aElectron microscopy.$2fast$0(OCoLC)fst00906682
650 7 $aField ion microscopy.$2fast$0(OCoLC)fst00923902
650 7 $aMicroprobe analysis.$2fast$0(OCoLC)fst01020006
655 4 $aElectronic books.
776 08 $iPrint version:$aMurr, Lawrence Eugene.$tElectron and ion microscopy and microanalysis.$b2nd ed., rev. and expanded.$dNew York : M. Dekker, ©1991$z0824785568$w(DLC) 91020173$w(OCoLC)23974033
830 0 $aOptical engineering (Marcel Dekker, Inc.) ;$vv. 29.
856 40 $uhttp://www.columbia.edu/cgi-bin/cul/resolve?clio15669992$zTaylor & Francis eBooks
852 8 $blweb$hEBOOKS