| Record ID | ia:environmentalstr0000kece |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/environmentalstr0000kece/environmentalstr0000kece_marc.xml |
| Download MARC binary | https://www.archive.org/download/environmentalstr0000kece/environmentalstr0000kece_meta.mrc |
LEADER: 00783cam a2200229 a 4500
001 95009917
003 DLC
005 19970508084700.2
008 950217s1995 njua b 001 0 eng
010 $a 95009917 //r97
020 $a0133242293
040 $aDLC$cDLC$dDLC
050 00 $aTA171$b.K43 1995
082 00 $a620/.0045$220
100 1 $aKececioglu, Dimitri.
245 10 $aEnvironmental stress screening :$bits quantification, optimization and management /$cDimitri Kececioglu, Feng-Bin Sun.
260 $aUpper Saddle River, N.J. :$bPrentice Hall,$cc1995.
300 $axxv, 520 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references and index.
650 0 $aElectronic apparatus and appliances$xTesting.
650 0 $aEnvironmental testing.
700 1 $aSun, Feng-bin.