MARC record from Internet Archive

LEADER: 02565nam 2200529 a 4500
001 ocn423007971
003 OCoLC
005 20100714082735.6
008 090708s1978 caua b f000 0 eng d
035 $a
035 $a
037 $aADA060451
040 $aAD#$cAD#
049 $aAD#A
086 0 $aD 208.14/2:NPS-61-78-005
088 $aNPS-61-78-005
100 1 $aFairall, C. W.
245 10 $aEvaporation duct height measurements in the Mid-Atlantic :$bfinal report /$cby C.W. Faiirall, K.L. Davidson, G.E. Schacher, and T.M. Houlihan.
260 $aMonterey, California :$bNaval Postgraduate School,$c1978.
300 $a1 v. (various pagings) :$bill. ;$c28 cm.
500 $aTitle from cover.
500 $a"Prepared for: Naval Oceanographic Office, Code 3404, NSTL Station, Bay St. Louis, Ms. 39522."
500 $aEnvironmental Physics Group, Naval Postgraduate School, Monterey, California 93940."
500 $a"15 August 1978"--Cover.
500 $a"NPS61-78-005"--Cover.
504 $aIncludes bibliographical references.
506 $a"Approved for public release; distribution is unlimited"--Cover.
513 $aTechnical report; 1978.
520 $aThis is a report on atmospheric boundary layer measurements made aboard the USNS Kane in February and March of 1978. The data has been analyzed to obtain Monin-Obukhov similarity parameters and EM propagation properties using bulk, profile and turbulence data. The evaporation duct height, Z*, was found to vary from 1.0 meters to 25 meters with a typical value of 16 meters. A comparison with profile and turbulence methods showed that the bulk method was accurate to within a factor of two, although some of the disagreement has been attributed to profile measurement inaccuracies. A sensitivity analysis showed that the relative humidity and air-sea temperature difference are the most critical measurements for bulk calculations of Z*
650 0 $aEvaporation (Meteorology)$xMeasurement.
650 0 $aBoundary layer (Meteorology)
650 0 $aAtmospheric turbulence.
650 0 $aElectromagnetic waves.
700 1 $aDavidson, Kenneth L.
700 1 $aSchacher, G. E.$q(Gordon Everett)
700 1 $aHoulihan, Thomas M.
710 2 $aNaval Postgraduate School (U.S.)
994 $aC0$bAD#
035 $a
035 $a
035 $a
035 $a
035 $a
592 $ack/ oclc 7/8/09.
035 $a
949 $lgen$nL$aQC915.5$b.F24$s1$tnorm$u00001$i32768001101728
926 $aNPS-LIB$bDIGIPROJ$cD 208.14/2:NPS-61-78-005$dTECH_RPT$eNEVER$f1