MARC record from Internet Archive

LEADER: 04223cam a2200625Ia 4500
001 13725434
005 20220528224307.0
006 m o d
007 cr cn|||||||||
008 110117s2000 waua ob 001 0 eng d
035 $a(OCoLC)ocn697174615
035 $a(NNC)13725434
040 $aKNOVL$beng$epn$cKNOVL$dCEF$dOCLCQ$dDEBSZ$dOCLCQ$dKNOVL$dZCU$dKNOVL$dJ2I$dSPIES$dEBLCP$dE7B$dN$T$dKNOVL$dYDXCP$dCNNAI$dOCLCQ$dMERUC$dOCLCA$dBUF$dREB$dKIJ$dRRP$dOCLCQ$dYOU$dU3W$dWYU$dOCLCQ$dERF$dOCLCQ$dMM9$dS2H$dOCLCO$dEUN$dOCLCO$dOCLCQ$dLVT$dUIU$dOCLCO
019 $a435912137$a858443749$a1027292132$a1048760306$a1229231631
020 $a9781615837304$q(electronic bk.)
020 $a1615837302$q(electronic bk.)
020 $a9780819478610$q(electronic bk.)
020 $a081947861X$q(electronic bk.)
020 $z0819438448$q(print)
020 $z9780819438447$q(print)
024 7 $a10.1117/3.387881$2doi
035 $a(OCoLC)697174615$z(OCoLC)435912137$z(OCoLC)858443749$z(OCoLC)1027292132$z(OCoLC)1048760306$z(OCoLC)1229231631
037 $bKnovel Corporation$nhttp://www.knovel.com
050 4 $aTL946$b.T75 2000eb
072 7 $aTEC$x009000$2bisacsh
082 04 $a629.47/4$222
084 $aUS 9500$2rvk
084 $aZM 7690$2rvk
049 $aZCUA
100 1 $aTribble, Alan C.,$d1961-
245 10 $aFundamentals of contamination control /$cAlan C. Tribble.
260 $aBellingham, Wash. :$bSPIE Press,$c©2000.
300 $a1 online resource (xv, 176 pages) :$billustrations
336 $atext$btxt$2rdacontent
337 $acomputer$bc$2rdamedia
338 $aonline resource$bcr$2rdacarrier
490 1 $aTutorial texts in optical engineering ;$vTT44
504 $aIncludes bibliographical references (pages 139-168) and index.
505 0 $a1. Introduction -- 2. Molecular contamination -- Effects of molecular films -- Quantifying molecular contamination -- Generation, transportation, and deposition of molecular contaminants -- Synergistic effects -- Estimating end of life molecular cleanliness requirements -- Predicting end of life molecular cleanliness levels -- Design guidelines for controlling molecular contamination -- 3. Particulate contamination -- Effects of particles -- Quantifying particulate contamination -- Generation, transportation, and deposition -- Particle redistribution during launch and on-orbit operations -- Estimating end of life particle cleanliness requirements -- Predicting end of life particulate cleanliness levels -- Design guidelines for controlling particulate contamination -- 4. Contamination control -- Preventing contamination -- Monitoring contamination -- Cleaning contaminated surfaces -- Maintaining surface cleanliness -- Launch and orbital operations.
520 $aThis Tutorial Text provides a comprehensive introduction to the subject of contamination control, with specific applications to the aerospace industry. The author draws upon his many years as a practicing contamination control engineer, researcher, and teacher. The book examines methods to quantify the cleanliness level required by various contamination-sensitive surfaces and to predict the end-of-life contamination level for those surfaces, and it identifies contamination control techniques required to ensure mission success.
588 0 $aPrint version record.
650 0 $aSpace vehicles$xContamination$xPrevention.
650 7 $aTECHNOLOGY & ENGINEERING$xEngineering (General)$2bisacsh
650 7 $aKontrolle$2gnd
650 7 $aOberfläche$2gnd
650 7 $aRaumfahrttechnik$2gnd
650 7 $aVerschmutzung$2gnd
650 7 $aVéhicules spatiaux$xContamination$xPrévention.$2ram
655 0 $aElectronic books.
655 4 $aElectronic books.
730 0 $aContamination control engineering design guidelines for the aerospace community.
776 08 $iPrint version:$aTribble, Alan C., 1961-$tFundamentals of contamination control.$dBellingham, Wash. : SPIE Press, ©2000$z0819438448$w(DLC) 00044541$w(OCoLC)44313475
830 0 $aTutorial texts in optical engineering ;$vTT44.
856 40 $uhttp://www.columbia.edu/cgi-bin/cul/resolve?clio13725434$zACADEMIC - Aerospace & Radar Technology
852 8 $blweb$hEBOOKS