| Record ID | ia:iddqtestingforcm0000rajs |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/iddqtestingforcm0000rajs/iddqtestingforcm0000rajs_marc.xml |
| Download MARC binary | https://www.archive.org/download/iddqtestingforcm0000rajs/iddqtestingforcm0000rajs_meta.mrc |
LEADER: 00736cam a2200229 a 4500
001 94021066
003 DLC
005 20070608082555.0
008 940602s1995 maua b 001 0 eng
010 $a 94021066
020 $a0890067260
040 $aDLC$cDLC$dDLC
050 00 $aTK7871.99.M44$bR35 1995
082 00 $a621.39/5/0287$220
100 1 $aRajsuman, Rochit.
245 10 $aIddq testing for CMOS VLSI /$cRochit Rajsuman.
260 $aBoston :$bArtech House,$cc1995.
300 $axii, 193 p.:$bill.;$c24 cm.
440 4 $aThe Artech House optoelectronics library.
504 $aIncludes bibliographical references(p.181-185) and index.
650 0 $aIddq testing.
650 0 $aIntegrated circuits$xVery large scale integration$xTesting.