| Record ID | ia:isbn_0819425435_3121 |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/isbn_0819425435_3121/isbn_0819425435_3121_marc.xml |
| Download MARC binary | https://www.archive.org/download/isbn_0819425435_3121/isbn_0819425435_3121_meta.mrc |
LEADER: 01309cam a2200313 a 4500
001 2004274365
003 DLC
005 20041001101142.0
008 040527s1997 waua b 101 0 eng d
010 $a 2004274365
020 $a0819425435
035 $a(OCoLC)ocm37842353
040 $aCUS$cCUS$dOCL$dDLC
042 $alccopycat
050 00 $aQC440$b.P648 1997
082 00 $a535.5/2/0287$222
245 00 $aPolarization :$bmeasurement, analysis, and remote sensing : 30 July-1 August 1997, San Diego, California /$cDennis H. Goldstein, Russell A. Chipman, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
260 $aBellingham, Wash., USA :$bSPIE,$cc1997.
300 $aix, 484 p. :$bill. ;$c28 cm.
490 1 $aSPIE proceedings series,$x0277-786X ;$vv. 3121
500 $aErrata sheets inserted.
504 $aIncludes bibliographical references and index.
650 0 $aPolarization (Light)$xMeasurement$vCongresses.
650 0 $aPolarimetry$vCongresses.
650 0 $aOptical instruments$xDesign and construction$vCongresses.
700 1 $aGoldstein, Dennis H.
700 1 $aChipman, Russell A.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 3121.