| Record ID | ia:isbn_0819445460_4779 |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/isbn_0819445460_4779/isbn_0819445460_4779_marc.xml |
| Download MARC binary | https://www.archive.org/download/isbn_0819445460_4779/isbn_0819445460_4779_meta.mrc |
LEADER: 01432cam a2200325 a 4500
001 2003535275
003 DLC
005 20030828093839.0
008 030423s2002 waua b 101 0 eng d
010 $a 2003535275
020 $a0819445460
035 $a(OCoLC)ocm51157395
040 $aLHL$cLHL$dDLC
042 $alccopycat
050 00 $aQC373$b.A38 2002
082 00 $a621.36$221
245 00 $aAdvanced characterization techniques for optical, semiconductor, and data storage components :$b9-11 July 2002, Seattle, Washington, USA /$cAngela Duparré, Bhanwar Singh, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA) ... [et al.].
260 $aBellingham, Washington :$bSPIE,$cc2002.
300 $aviii, 192 p. :$bill. ;$c28 cm.
490 1 $aSPIE proceedings series,$x0277-786X ;$vv. 4779
504 $aIncludes bibliographic references and author index.
650 0 $aOptical materials$vCongresses.
650 0 $aSemiconductors$xCharacterization$vCongresses.
650 0 $aInformation storage and retrieval systems$vCongresses.
650 0 $aMetrology$vCongresses.
700 1 $aDuparré, Angela.
700 1 $aSingh, Bhanwar.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
710 2 $aBoeing Company.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 4779.