| Record ID | ia:isbn_081945642 |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/isbn_081945642/isbn_081945642_marc.xml |
| Download MARC binary | https://www.archive.org/download/isbn_081945642/isbn_081945642_meta.mrc |
LEADER: 01601cam a22003377a 4500
001 2005279828
003 DLC
005 20140710075554.0
008 050811s2005 waua b 101 0 eng d
010 $a 2005279828
020 $a081945642X (pbk.)
035 $a(OCoLC)ocm58973793
040 $aLHL$cLHL$dIXA$dOCL$dCLU$dDLC
042 $alccopycat
050 00 $aQA76.9.D3$bV595 2005
082 00 $a005.74$222
245 00 $aVisualization and data analysis 2005 :$b17-18 January 2005, San Jose, California, USA /$cRobert F. Erbacher ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society of Optical Engineering [and] IS&T-the Society of Imaging Science and Technology.
260 $aBellingham, Wash. :$bSPIE ;$aSpringfield, Va. :$bIS&T,$cc2005.
300 $aviii, 396 p. :$bill. (some col.) ;$c28 cm.
490 1 $aProceedings of Electronic Imaging Science and Technology
490 1 $aSPIE,$x0277-786X ;$vvol. 5669
504 $aIncludes bibliographical references and author index.
650 0 $aDatabase management$vCongresses.
650 0 $aInformation visualization$vCongresses.
650 0 $aVisualization$vCongresses.
650 0 $aComputer graphics$vCongresses.
700 1 $aErbacher, Robert F.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
710 2 $aIS & T--the Society for Imaging Science and Technology.
811 2 $aElectronic Imaging Science and Technology Symposium.$tProceedings of Electronic Imaging Science and Technology.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 5669.