| Record ID | ia:javatestingpatte0000unse |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/javatestingpatte0000unse/javatestingpatte0000unse_marc.xml |
| Download MARC binary | https://www.archive.org/download/javatestingpatte0000unse/javatestingpatte0000unse_meta.mrc |
LEADER: 01084cam a2200301 a 4500
001 2004303624
003 DLC
005 20060722204344.0
008 041021s2004 inua 001 0 eng d
010 $a 2004303624
040 $aTSU$cTSU$dDLC
020 $a047144846X
035 $a(OCoLC)ocm56699741
042 $alccopycat
050 00 $aQA76.73.J38$bJ3857 2004
082 00 $a005.13/3$222
245 00 $aJava testing patterns /$cJon Thomas ... [et al.]
260 $aIndianapolis, Ind. :$bWiley,$cc2004.
300 $axxiii, 400 p. :$bill. ;$c24 cm.
500 $aIncludes index.
650 0 $aJava (Computer program language)
650 0 $aComputer software$xDevelopment.
650 0 $aComputer software$xTesting.
650 0 $aSoftware patterns.
700 1 $aThomas, Jon.
856 41 $3Table of contents only$uhttp://www.loc.gov/catdir/toc/wiley051/2004303624.html
856 42 $3Contributor biographical information$uhttp://www.loc.gov/catdir/enhancements/fy0620/2004303624-b.html
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0620/2004303624-d.html