| Record ID | ia:measurementofint00term |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/measurementofint00term/measurementofint00term_marc.xml |
| Download MARC binary | https://www.archive.org/download/measurementofint00term/measurementofint00term_meta.mrc |
LEADER: 01072cam 2200265 a 4500
001 001460616-X
005 20100614163116.0
008 711222s1916 maua b 00110 eng
010 $a 16014608
035 0 $aocm00186102
035 0 $aocm00186102$zocm00268757
035 0 $aocm00268757
040 $aDLC$cWSU$dXBM$dPIT$dOCL$dLEC$dCRL
050 0 $aLB1131$b.T4
100 1 $aTerman, Lewis Madison,$d1877-1956.
245 14 $aThe measurement of intelligence :$ban explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale /$cby Lewis M. Terman.
246 3 $aBinet-Simon intelligence scale.
260 0 $aBoston :$bHoughton Mifflin Company,$c[c1916].
300 $axviii, 362 p. :$bill. ;$c20 cm.
490 0 $aRiverside textbooks in education
500 $aIncludes index.
504 $a"Selected references": p. [349]-356; "Suggestions for a teacher's private library on exceptional children": p. [357]-358.
650 0 $aIntelligence tests.
650 0 $aBinet-Simon Test.
650 2 $aIntelligence Tests.