| Record ID | ia:microscopicident0000unse |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/microscopicident0000unse/microscopicident0000unse_marc.xml |
| Download MARC binary | https://www.archive.org/download/microscopicident0000unse/microscopicident0000unse_meta.mrc |
LEADER: 01051cam a2200265 a 4500
001 85019753
003 DLC
005 19920813135410.5
008 850816s1985 paua b 101 0 eng
010 $a 85019753 //r92
020 $a0931837111 :$c$50.00
040 $aDLC$cDLC$dDLC
050 00 $aTK7871.85$b.M53 1985
082 00 $a621.3815/2$219
245 00 $aMicroscopic identification of electronic defects in semiconductors :$bsymposium held April 15-18, 1985, San Francisco, California, U.S.A. /$ceditors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins.
260 0 $aPittsburgh, Pa. :$bMaterials Research Society,$cc1985.
300 $axv, 604 p. :$bill. ;$c24 cm.
440 0 $aMaterials Research Society symposia proceedings,$x0272-9172 ;$vv. 46
504 $aIncludes bibliographies and indexes.
650 0 $aSemiconductors$xDefects$xCongresses.
650 0 $aSemiconductors$xMicroscopy$xCongresses.
700 10 $aJohnson, Noble M.
700 10 $aBishop, Stephen G.
700 10 $aWatkins, George D.
710 20 $aMaterials Research Society.