| Record ID | ia:microstructuralc0000bran |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/microstructuralc0000bran/microstructuralc0000bran_marc.xml |
| Download MARC binary | https://www.archive.org/download/microstructuralc0000bran/microstructuralc0000bran_meta.mrc |
LEADER: 00925cam 22003017a 4500
001 2007041704
001 0116405840061
003 DLC
005 20080807194131.0
008 071005s2008 enk b 001 0 eng
010 $a 2007041704
020 $a9780470027844 (cloth)
020 $a0470027843
035 $a(Sirsi) i9780470027844
037 $bMidwest
040 $aOPET$beng
050 00 $aTA417.23$b.B73 2008
082 00 $a620.1/1299$222
100 1 $aBrandon, D. G.
245 10 $aMicrostructural characterization of materials /$cDavid Brandon and Wayne Kaplan.
250 $a2nd ed.
260 $aChichester, England :$bJohn Wiley & Sons,$cc2008.
300 $axiv, 536 p. :$bill. (some col.) ;$c25 cm.
490 0 $aQuantitative software engineering series
504 $aIncludes bibliographical references and index.
650 0 $aMaterials$xMicroscopy.
650 0 $aMicrostructure.
700 1 $aKaplan, Wayne D.