MARC record from Internet Archive

LEADER: 04443cam 2200697Ia 4500
001 ocn435816746
003 OCoLC
005 20200427013110.0
008 090904s1995 nyua ob 001 0 eng d
006 m o d
007 cr cnu---unuuu
040 $aN$T$beng$epn$cN$T$dOCLCQ$dEBLCP$dIDEBK$dE7B$dOCLCQ$dSHS$dMHW$dOCLCQ$dOCLCF$dOCLCQ$dOCLCO$dOCLCQ$dAZK$dAGLDB$dMOR$dPIFAG$dZCU$dOCLCQ$dMERUC$dOCLCQ$dU3W$dSTF$dWRM$dOCLCQ$dVTS$dNRAMU$dICG$dINT$dVT2$dAU@$dOCLCQ$dWYU$dOCLCQ$dDKC$dOCLCQ
019 $a548633913$a647837337$a961615711$a962618655$a988508600$a991922982$a1035703307$a1037929800$a1038571970$a1045538862$a1055382634$a1058104957$a1066600498$a1081261126
020 $a9780195358469$q(electronic bk.)
020 $a0195358465$q(electronic bk.)
020 $z0195088743$q(acid-free paper)
020 $z9780195088748
035 $a(OCoLC)435816746$z(OCoLC)548633913$z(OCoLC)647837337$z(OCoLC)961615711$z(OCoLC)962618655$z(OCoLC)988508600$z(OCoLC)991922982$z(OCoLC)1035703307$z(OCoLC)1037929800$z(OCoLC)1038571970$z(OCoLC)1045538862$z(OCoLC)1055382634$z(OCoLC)1058104957$z(OCoLC)1066600498$z(OCoLC)1081261126
050 4 $aQH212.E4$bJ67 1995eb
072 7 $aSCI$x023000$2bisacsh
082 04 $a502/.8/25$222
100 1 $aJoy, David C.,$d1943-
245 10 $aMonte Carlo modeling for electron microscopy and microanalysis /$cDavid C. Joy.
260 $aNew York :$bOxford University Press,$c1995.
300 $a1 online resource (viii, 216 pages) :$billustrations
336 $atext$btxt$2rdacontent
337 $acomputer$bc$2rdamedia
338 $aonline resource$bcr$2rdacarrier
490 1 $aOxford series in optical and imaging sciences ;$v9
504 $aIncludes bibliographical references and index.
505 0 $a1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index.
520 $a1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations?
588 0 $aPrint version record.
650 0 $aElectron microscopy$xComputer simulation.
650 0 $aElectron probe microanalysis$xComputer simulation.
650 0 $aMonte Carlo method.
650 7 $aSCIENCE$xElectron Microscopes & Microscopy.$2bisacsh
650 7 $aElectron microscopy$xComputer simulation.$2fast$0(OCoLC)fst00906683
650 7 $aElectron probe microanalysis$xComputer simulation.$2fast$0(OCoLC)fst00906706
650 7 $aMonte Carlo method.$2fast$0(OCoLC)fst01025819
653 0 $aElectron microscopy
655 4 $aElectronic books.
776 08 $iPrint version:$aJoy, David C., 1943-$tMonte Carlo modeling for electron microscopy and microanalysis.$dNew York : Oxford University Press, 1995$z0195088743$z9780195088748$w(DLC) 94035642$w(OCoLC)31287442
830 0 $aOxford series in optical and imaging sciences ;$v9.
856 40 $3ebrary$uhttp://site.ebrary.com/id/10358552
856 40 $3EBSCOhost$uhttps://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287517
856 40 $3MyiLibrary$uhttp://www.myilibrary.com?id=53489
856 40 $3ProQuest Ebook Central$uhttps://public.ebookcentral.proquest.com/choice/publicfullrecord.aspx?p=430981
856 40 $uhttp://VH7QX3XE2P.search.serialssolutions.com/?V=1.0&L=VH7QX3XE2P&S=JCs&C=TC0000205322&T=marc&tab=BOOKS
856 41 $3MyiLibrary, Table of contents$uhttp://www.myilibrary.com?id=53489&ref=toc
938 $aEBL - Ebook Library$bEBLB$nEBL430981
938 $aebrary$bEBRY$nebr10358552
938 $aEBSCOhost$bEBSC$n287517
938 $aProQuest MyiLibrary Digital eBook Collection$bIDEB$n53489
029 1 $aAU@$b000051586053
029 1 $aDEBBG$bBV043153179
029 1 $aDEBBG$bBV044135405
029 1 $aDEBSZ$b421957964
029 1 $aNZ1$b15322984
994 $aZ0$bP4A
948 $hNO HOLDINGS IN P4A - 1377 OTHER HOLDINGS