| Record ID | ia:multisensorinstr0000garr |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/multisensorinstr0000garr/multisensorinstr0000garr_marc.xml |
| Download MARC binary | https://www.archive.org/download/multisensorinstr0000garr/multisensorinstr0000garr_meta.mrc |
LEADER: 01227cam a22002894a 4500
001 2001046730
003 DLC
005 20040726090352.0
008 010907s2002 nyua b 001 0 eng
010 $a 2001046730
020 $a0471205060 (cloth : alk. paper)
040 $aDLC$cDLC$dDLC
042 $apcc
050 00 $aTA1750$b.G37 2002
082 00 $a670.42/7$221
100 1 $aGarrett, Patrick H.
245 10 $aMultisensor instrumentation 6[sigma] design :$bdefined accuracy computer-integrated measurement systems /$cPatrick H. Garrett.
260 $aNew York :$bJ. Wiley,$cc2002.
300 $ax, 213 p.$bill. ;$c24 cm.+$e1 floppy disk (3 1/2 in.)
500 $aTitle has numeral 6 followed by Greek sigma.
500 $a"A Wiley-Interscience publication."
504 $aIncludes bibliographical references and index.
650 0 $aElectrooptical devices$xTesting$vCongresses.
650 0 $aAutomatic test equipment$vCongresses.
856 42 $3Contributor biographical information$uhttp://www.loc.gov/catdir/bios/wiley043/2001046730.html
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/description/wiley036/2001046730.html
856 41 $3Table of contents$uhttp://www.loc.gov/catdir/toc/wiley021/2001046730.html