| Record ID | ia:nondestructiveev3396unse |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/nondestructiveev3396unse/nondestructiveev3396unse_marc.xml |
| Download MARC binary | https://www.archive.org/download/nondestructiveev3396unse/nondestructiveev3396unse_meta.mrc |
LEADER: 01500cam a2200337 a 4500
001 98184991
003 DLC
005 20040609180644.0
008 980311s1998 wau b 101 0 eng d
010 $a 98184991
020 $a0819428450
035 $a(OCoLC)38585536
040 $aCU-S$cCU-S$dDLC
042 $alccopycat
050 04 $aTA417.2$b.N656974 1998
082 00 $a620.1/127$221
245 00 $aNondestructive evaluation of materials and composites II :$b31 March-1 April 1998, San Antonio, Texas /$cSteven R. Doctor, Carol A. Lebowitz, George Y. Baaklini, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ... [et al.] ; cooperating organizations, NIST--National Institute of Standards and Technology ... [et al.].
260 $aBellingham, Wash., USA :$bSPIE,$cc1998.
300 $avi, 294 p. :$bill. ;$c28 cm.
490 1 $aSPIE proceedings series ;$vv. 3396
504 $aIncludes bibliographical references and index.
650 0 $aNondestructive testing$vCongresses.
650 0 $aMaterials$xTesting$vCongresses.
650 0 $aComposite materials$xTesting$vCongresses.
650 0 $aSurfaces (Technology)$vCongresses.
700 1 $aDoctor, S. R.
700 1 $aLebowitz, Carol A.
700 1 $aBaaklini, George Y.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
710 2 $aNational Institute of Standards and Technology (U.S.)
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 3396.