| Record ID | ia:nondestructiveev4336unse |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/nondestructiveev4336unse/nondestructiveev4336unse_marc.xml |
| Download MARC binary | https://www.archive.org/download/nondestructiveev4336unse/nondestructiveev4336unse_meta.mrc |
LEADER: 01154cam a2200301 a 4500
001 2001277716
003 DLC
005 20040609180845.0
008 011210s2001 waua b 101 0 eng d
010 $a 2001277716
035 $a(OCoLC)ocm48147247
040 $aCUS$cCUS$dDLC
042 $alccopycat
020 $a0819440221
050 00 $aTA417.2$b.N6518 2001
082 00 $a620.1/127$221
245 00 $aNondestructive evaluation of materials and composites V :$b7-8 March 2001, Newport Beach, USA /$cGeorge Y. Baaklini ... [et al.], chairs/editors.
260 $aBellingham, Wash., USA :$bSPIE,$cc2001.
300 $axxvi, 230 p. :$bill. ;$c28 cm.
490 1 $aSPIE proceedings series ;$vv. 4336
504 $aIncludes bibliographical references and index.
650 0 $aNondestructive testing$vCongresses.
650 0 $aMaterials$xTesting$vCongresses.
650 0 $aComposite materials$xTesting$vCongresses.
650 0 $aSurfaces (Technology)$vCongresses.
700 1 $aBaaklini, George Y.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 4336.