| Record ID | ia:semiconductorsse0046unse |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/semiconductorsse0046unse/semiconductorsse0046unse_marc.xml |
| Download MARC binary | https://www.archive.org/download/semiconductorsse0046unse/semiconductorsse0046unse_meta.mrc |
LEADER: 00937cam a2200241 a 4500
001 8895de1833764f25afd4afe966be70cd
003 UK-BiTAL
005 20050705143157.0
008 970623s1997 enka 000 ||eng|d
015 $aGB9744188$2bnb
020 $a0127521461 :
035 $a()0127521461
040 $dUK-BiTAL
082 04 $a537.622$221
245 00 $aSemiconductors and semimetals :$ba treatise /$cedited by R. K. Willardson, Eicke R. Weber. Vol.46, Effect of disorder and defects in ion-implanted semiconductors : optical and photothermal characterization / volume editors Constantinos Christofides, Gérard Ghibaudo.
260 $aSan Diego ;$aLondon :$bAcademic Press,$c1997.
300 $axvi, 316p. :$bill. ;$c24 cm.
650 0 $aSemiconductors.
650 0 $aSemimetals.
700 1 $aChristofides, Constantinos.
700 1 $aGhibaudo, Gérard.
700 1 $aWillardson, R. K.$q(Robert Kent),$d1923-
700 1 $aWeber, Eicke R.