| Record ID | ia:softwaretestingt0000unse |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/softwaretestingt0000unse/softwaretestingt0000unse_marc.xml |
| Download MARC binary | https://www.archive.org/download/softwaretestingt0000unse/softwaretestingt0000unse_meta.mrc |
LEADER: 00867cam 2200265 4500
001 2004018169
001 0116405438882
003 DLC
005 20050502 .0
008 040803s2005 maua b 001 0 eng
010 $a 2004018169
020 $a1584503467 (pbk. : acid-free paper)
035 $a(Sirsi) l2004018169
040 $aDLC$beng$cDLC$dDLC
040 $aOPET$beng
050 00 $aQA 76.76 .T48 S645 2005
082 00 $a005.1/4$222
245 00 $aSoftware testing techniques :$bfinding the defects that matter /$cScott Loveland ... [et al.].
250 $a1st ed.
260 $aHingham, Mass. :$bCharles River Media,$cc2005.
300 $axxii, 362 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references (p. 335-337) and index.
650 0 $aComputer software$xTesting.
650 0 $aComputer software$xReliability.
700 1 $aLoveland, Scott.