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LEADER: 08355cam 22007934a 4500
001 ocm42810854
003 OCoLC
005 20200511193124.0
008 991104s2000 nyua b 001 0 eng
010 $a 99057532
040 $aDLC$beng$cDLC$dUKM$dUBA$dBAKER$dNLGGC$dBTCTA$dLVB$dYDXCP$dIG#$dDEBBG$dVA@$dILU$dBDX$dOCLCF$dP4A$dOCLCQ$dOCLCO$dOCLCQ$dDHA$dOCLCQ$dAZU$dOCLCQ$dOCLCO
015 $aGBA050546$2bnb
015 $aGBA0Y3759$2bnb
019 $a43820295
020 $a0471349410$q(alk. paper)
020 $a9780471349419$q(alk. paper)
035 $a(OCoLC)42810854$z(OCoLC)43820295
042 $apcc
050 00 $aTA169$b.B38 2000
082 00 $a620/.00452$221
084 $a31.73$2bcl
084 $aSK 850$2rvk
084 $aZG 9270$2rvk
100 1 $aRigdon, Steven E.,$d1955-
245 10 $aStatistical methods for the reliability of repairable systems /$cSteven E. Rigdon, Asit P. Basu.
260 $aNew York :$bWiley,$c2000.
300 $axii, 281 pages :$billustrations ;$c25 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
338 $avolume$bnc$2rdacarrier
490 1 $aWiley series in probability and statistics
500 $a"A Wiley-Interscience publication."
504 $aIncludes bibliographical references (pages 267-275) and index.
505 00 $g1.2$tNonrepairable Systems$g7 --$g1.2.1$tExponential Distribution$g12 --$g1.2.2$tWeibull Distribution$g16 --$g1.2.3$tGamma Distribution$g19 --$g1.3$tBasic Theory of Point Processes$g23 --$g1.4$tOverview of Models$g30 --$g2$tProbabilistic Models: The Poisson Process$g33 --$g2.1$tPoisson Process$g33 --$g2.2$tHomogeneous Poisson Process$g45 --$g2.2.1$tGap Lengths for the HPP$g52 --$g2.3$tNonhomogeneous Poisson Process$g53 --$g2.3.1$tLikelihood Functions$g54 --$g2.3.2$tTime Truncated Case$g58 --$g3$tProbabilistic Models: Renewal and Other Processes$g65 --$g3.1$tRenewal Process$g65 --$g3.2$tPiecewise Exponential Model$g74 --$g3.3$tModulated Processes$g75 --$g3.4$tBranching Poisson Process$g78 --$g3.5$tImperfect Repair Models$g82 --$g4$tAnalyzing Data from a Single Repairable System$g87 --$g4.1$tGraphical Methods$g87 --$g4.1.1$tDuane Plots$g90 --$g4.1.2$tTotal Time on Test Plots$g96 --$g4.2$tNonparametric Methods for Estimating [lambda]$g99 --$g4.2.1$tNatural Estimates of the Intensity Function$g99 --$g4.2.2$tKernel Estimates$g100 --$g4.2.3$tAn Estimate Assuming a Convex Intensity Function$g100 --$g4.3$tTesting for the Homogeneous Poisson Process$g106 --$g4.4$tInference for the Homogeneous Poisson Process$g112 --$g4.5$tInference for the Power Law Process: Failure Truncated Case$g116 --$g4.5.1$tPoint Estimation for [beta] and [theta]$g116 --$g4.5.2$tInterval Estimation and Tests of Hypotheses$g119 --$g4.5.3$tEstimation of the Intensity Function$g124 --$g4.5.4$tGoodness-of-Fit Tests$g127 --$g4.6$tStatistical Inference for the Time Truncated Case$g135 --$g4.6.1$tPoint Estimation for [beta] and [theta]$g135 --$g4.6.2$tInterval Estimation and Tests of Hypotheses$g137 --$g4.6.3$tEstimation of the Intensity Function$g139 --$g4.6.4$tGoodness-of-Fit Tests$g141 --$g4.7$tEffect of Assuming an HPP when the True Process is a Power Law Process$g144 --$g4.8$tBayesian Estimation$g146 --$g4.8.1$tBayesian Inference for the Parameters of the HPP$g148 --$g4.8.2$tBayesian Inference for Predicting the Number of Failures from the HPP$g152 --$g4.8.3$tBayesian Inference for the Parameters of the Power Law Process$g154 --$g4.8.4$tBayesian Inference for Predicting the Number of Failures$g161 --$g4.9$tInference for a Modulated Power Law Process$g162 --$g4.9.1$tMaximum Likelihood Estimation of [theta], [beta], and [kappa]$g162 --$g4.9.2$tHypothesis Tests for the Modulated Power Law Process$g165 --$g4.9.3$tConfidence Intervals for Parameters$g166 --$g4.10$tInference for the Piecewise Exponential Model$g168 --$g4.11$tStandards$g172 --$g4.11.1$tMIL-HDBK-189$g172 --$g4.11.2$tMIL-HDBK-781 and MIL-STD-781$g173 --$g4.11.3$tANSI/IEC/ASQ 61164$g175 --$g4.12$tOther Inference Procedures for Repairable Systems$g176 --$g5$tAnalyzing Data from Multiple Repairable Systems$g181 --$g5.1$tIdentical Homogeneous Poisson Processes$g181 --$g5.1.1$tPoint Estimation for [theta]$g182 --$g5.1.2$tInterval Estimation for [theta]$g183 --$g5.1.3$tHypothesis Testing for [theta]$g186 --$g5.2$tNonidentical Homogeneous Poisson Processes$g189 --$g5.2.1$tTwo Failure Truncated Systems$g189 --$g5.2.2$t[kappa] Systems$g191 --$g5.3$tParametric Empirical Bayes and Hierarchical Bayes Models for the HPP$g193 --$g5.3.1$tParametric Empirical Bayes Models$g195 --$g5.3.2$tHierarchical Bayes Models$g204 --$g5.4$tPower Law Process for Identical Systems$g207 --$g5.5$tTesting for the Equality of the Growth Parameters in the Power Law Process$g213 --$g5.5.1$tTesting Equality of [beta]'s for Two Systems$g215 --$g5.5.2$tTesting Equality of [beta]'s for [kappa] Systems$g217 --$g5.6$tPower Law Process for Nonidentical Systems$g218 --$g5.7$tParametric Empirical Bayes Models for the PLP$g221 --$gA.1$tCritical Values for the Chi-square Distribution$g230 --$gA.2$tCritical Values for the F Distribution$g236 --$gA.3$tConfidence Limits for the Mean of a Poisson Distribution Given an Observation of c Events$g242 --$gA.4$tFactors for Obtaining a Confidence Interval for the Intensity at the Time of the Last Failure for a Failure Truncated Power Law Process$g244 --$gA.5$tFactors for Obtaining a Confidence Interval for the Intensity at the Time of the Last Failure for a Time Truncated Power Law Process$g250 --$gA.6$tCritical Values for the Cramer-von Mises Goodness-of-fit Test$g256 --$gA.7$tCritical Values for Lilliefors' Goodness-of-fit Test$g260.
520 1 $a"This new work offers a unique, systematic treatment of probabilistic models used for repairable systems as well as the statistical methods for analyzing data generated from them."
520 8 $a"Liberally supplemented with examples as well as exercises boasting real data, the book clearly explains the difference between repairable and nonrepairable systems and helps readers develop an understanding of stochastic point processes. Data analysis methods are discussed for both single and multiple systems and include graphical methods, point estimation, interval estimation, hypothesis tests, goodness-of-fit tests, and reliability prediction. Complete with extensive graphs, tables, and references, Statistical Methods for the Reliability of Repairable Systems is an excellent working resource for industry professionals involved in producing reliable systems and a handy reference for practitioners and researchers in the field."--Jacket.
650 0 $aReliability (Engineering)$xStatistical methods.
650 0 $aMaintainability (Engineering)$xStatistical methods.
650 6 $aFiabilite $xMe thodes statistiques.
650 6 $aMaintenabilite $xMe thodes statistiques.
650 7 $aMaintainability (Engineering)$xStatistical methods.$2fast$0(OCoLC)fst01006141
650 7 $aReliability (Engineering)$xStatistical methods.$2fast$0(OCoLC)fst01093658
650 17 $aWaarschijnlijkheidstheorie.$2gtt
650 17 $aStatistische betrouwbaarheid.$2gtt
650 17 $aOnderhoud.$2gtt
650 7 $aInstandhaltungstheorie$2gnd
650 7 $aZuverla ssigkeitstheorie$2gnd
650 7 $aEstati stica.$2larpcal
650 7 $aEngenharia (confiabilidade)$2larpcal
700 1 $aBasu, Asit P.
830 0 $aWiley series in probability and statistics.
856 41 $3Table of contents$uhttp://catdir.loc.gov/catdir/toc/onix06/99057532.html
856 42 $3Contributor biographical information$uhttp://catdir.loc.gov/catdir/bios/wiley043/99057532.html
856 42 $3Publisher description$uhttp://catdir.loc.gov/catdir/description/wiley035/99057532.html
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938 $aYBP Library Services$bYANK$n1650225
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948 $hHELD BY P4A - 185 OTHER HOLDINGS