| Record ID | ia:structuremeasure0000eyse |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/structuremeasure0000eyse/structuremeasure0000eyse_marc.xml |
| Download MARC binary | https://www.archive.org/download/structuremeasure0000eyse/structuremeasure0000eyse_meta.mrc |
LEADER: 00855cam 22002770i 4500
001 0116300473125
008 780908s1979 wb a b 11 eng d
010 $a 78010591 //r84
020 $a0387090282
035 $a(Sirsi) AAD-5467
035 $a22656655.C..
040 $aOPET$beng
046 $aDLC$cDLC
050 00 $aBF431$b.E97
082 $a153.9
090 0 $aBF 431 .E97$bb
100 1 $aEysenck, H. J.$q(Hans Jurgen),$d1916-
245 14 $aThe structure and measurement of intelligence /$cHans J. Eysenck, with contributions by David W. Fulker. --
260 $aBerlin ;$aNew York :$bSpringer-Verlag,$c1979.
300 $a253 p. :$bill. ;$c25 cm.
500 $aIncludes index.
504 $aBibliography: p. 237-249.
650 0 $aIntellect.
650 0 $aIntelligence tests.
650 0 $aNature and nurture.
700 10 $aFulker, David W.,$d1937-