| Record ID | ia:surfaceanalysisp0000unse |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/surfaceanalysisp0000unse/surfaceanalysisp0000unse_marc.xml |
| Download MARC binary | https://www.archive.org/download/surfaceanalysisp0000unse/surfaceanalysisp0000unse_meta.mrc |
LEADER: 04815cam 2201021 a 4500
001 ocm35848935
003 OCoLC
005 20220113052833.0
008 961031s1997 enka b 001 0 eng
010 $a 96037348
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050 00 $aTA418.7$b.S726 1997
070 0 $aTA418.7.S726$b1997
072 0 $aX400
072 0 $aX600
080 $a541.183
082 00 $a620/.44$221
084 $aPHY 160f$2stub
084 $aUP 7500$2rvk
084 $aZM 7605$2rvk
084 $a541.183
084 $a33.68$2bcl
084 $a51.22$2bcl
245 00 $aSurface analysis :$bthe principal techniques /$cedited by John C. Vickerman.
260 $aChichester [England] ;$aNew York :$bJohn Wiley,$c©1997.
300 $axvi, 457 pages :$billustrations ;$c24 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
338 $avolume$bnc$2rdacarrier
504 $aIncludes bibliographical references and index.
505 00 $gCh. 1.$tIntroduction /$rJohn C. Vickerman --$gCh. 2.$tVacuum Technology for Applied Surface Science /$rRod Wilson --$gCh. 3.$tElectron Spectroscopy for Chemical Analysis /$rBuddy Ratner and David Castner --$gCh. 4.$tAuger Electron Spectroscopy /$rHans Jorg and Mathieu --$gCh. 5.$tSecondary Ion Mass Spectrometry -- the Surface Mass Spectrometry /$rJohn C. Vickerman and Andrew Swift --$gCh. 6.$tLow-energy Ion Scattering and Rutherford Backscattering /$rEdmund Taglauer --$gCh. 7.$tVibrational Spectroscopy from Surfaces /$rMartyn Pemble --$gCh. 8.$tSurface Structure Determination by Interference Techniques /$rWendy R. Flavell --$gCh. 9.$tScanning Tunnelling Microscopy and Atomic Force Microscopy /$rGraham Leggett.
546 $aEnglish.
520 $aThis work examines the characterization and understanding of the outer layers of substrates. From the basic principles of surface analysis, the book considers the various techniques used to analyze surfaces and the theory required to understand the results.
650 0 $aSurfaces (Technology)$xAnalysis.
650 0 $aSpectrum analysis.
650 7 $a33.68 surfaces, interfaces and thin layers.$0(NL-LeOCL)077595742$2bcl
650 7 $a51.22 surfaces, interfaces and thin layers.$0(NL-LeOCL)077604059$2bcl
650 7 $aSpectrum analysis.$2fast$0(OCoLC)fst01129108
650 7 $aSurfaces (Technology)$xAnalysis.$2fast$0(OCoLC)fst01139279
650 7 $aOberflächenanalyse$2gnd
650 7 $aAufsatzsammlung$2gnd
650 17 $aSurfaces.$0(NL-LeOCL)078615453$2gtt
650 7 $aSURFACES.$2nasat
650 7 $aSPECTRUM ANALYSIS.$2nasat
650 7 $aANALYZING.$2nasat
650 7 $aChimie des surfaces.$2ram
650 7 $aSurfaces (technologie)$xAnalyse.$2ram
650 7 $aSurfaces (physique)$2ram
650 7 $aSpectroscopie.$2ram
650 7 $aSpectroscopie électronique.$2ram
650 7 $aOberflächenanalyse.$2swd
650 7 $aAufsatzsammlung.$2swd
653 00 $acolloids
653 00 $aoppervlaktechemie
653 00 $asurface chemistry
653 10 $aChemistry (General)
653 20 $aAnalytical Chemistry
653 10 $aChemie (algemeen)
653 20 $aAnalytische chemie
655 4 $aAufsatzsammlung.
655 7 $aAufsatzsammlung.$2swd
700 1 $aVickerman, J. C.
776 08 $iOnline version:$tSurface analysis.$dChichester [England] ; New York : John Wiley, ©1997$w(OCoLC)644154948
856 41 $3Table of contents$uhttp://catdir.loc.gov/catdir/toc/wiley022/96037348.html
856 42 $3Publisher description$uhttp://catdir.loc.gov/catdir/description/wiley032/96037348.html
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