| Record ID | ia:testcritiques03keys |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/testcritiques03keys/testcritiques03keys_marc.xml |
| Download MARC binary | https://www.archive.org/download/testcritiques03keys/testcritiques03keys_meta.mrc |
LEADER: 00937cam 2200289 a 4500
001 ocm12906710
003 CStRLIN
005 19940805000000.0
008 851002m19849999mou b 000 0 eng
010 $a84026895
020 $a0961128666 (v. 1) :
040 $dCStRLIN$dWaBeW
090 $aBF176$b.T419 1984
245 00 $aTest critiques /$cDaniel J. Keyser, Richard C. Sweetland, general editors.
260 $aKansas City, Mo. :$bTest Corporation of America,$cc1984-
300 $av. ;$c24 cm.
504 $aIncludes bibliographies.
650 0 $aPsychological tests$xEvaluation.
650 0 $aEducational tests and measurements$xEvaluation.
650 0 $aBusiness$xExaminations$xEvaluation.
700 10 $aKeyser, Daniel J.,$d1935-
700 10 $aSweetland, Richard C.,$d1931-
907 $a.b13981420$br $c-
902 $a070705
998 $b10$c950214$dm$ea$f-$g0
941 $aWAWC85-B2599
940 $aBF176$b.T419 1984$lEdR$z090