| Record ID | ia:testcritiquescom0000unse |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/testcritiquescom0000unse/testcritiquescom0000unse_marc.xml |
| Download MARC binary | https://www.archive.org/download/testcritiquescom0000unse/testcritiquescom0000unse_meta.mrc |
LEADER: 00926pam 2200253 a 4500
001 87010247
003 DLC
005 19880324000000.0
008 870612s1987 mou b 00100 eng
010 $a 87010247
020 $a093370108X :$c$49.00
020 $a0933701098 (pbk.) :$c$29.00
050 0 $aBF176$b.T4195 1987
082 0 $a150/.28/7$219
245 00 $aTest critiques compendium :$breviews of major tests from the Test critiques series /$cDaniel J. Keyser, Richard C. Sweetland, general editors.
260 0 $aKansas City, Mo. :$bTest Corp. of America,$cc1987.
300 $ax, 626 p. ;$c24 cm.
504 $aIncludes bibliographies and indexes.
650 0 $aPsychological tests$xEvaluation.
650 0 $aEducational tests and measurements$xEvaluation.
650 0 $aNeuropsychological tests$xEvaluation.
700 10 $aKeyser, Daniel J.,$d1935-
700 10 $aSweetland, Richard C.,$d1931-
730 01 $aTest critiques.