| Record ID | ia:thermosensexxv225073inte |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/thermosensexxv225073inte/thermosensexxv225073inte_marc.xml |
| Download MARC binary | https://www.archive.org/download/thermosensexxv225073inte/thermosensexxv225073inte_meta.mrc |
LEADER: 01357cam 2200289Ia 4500
001 ocm52180976
005 20031125124238.0
008 030505s2003 waua b 101 0 eng d
020 $a0819449326
039 $f//rp
050 4 $aTR692.5$b.P763 v.5073
111 2 $aInternational Conference on Thermal Sensing and Imaging Diagnostic Applications$d(2003 :$cOrlando, Fla.)
245 10 $aThermosense XXV :$b22-24 April 2003, Orlando, Florida, USA /$cK. Elliott Cramer, Xavier P. Maldague, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
246 3 $aThermosense 25
246 3 $aThermosense twenty-five
260 $aBellingham, Wash., USA :$bSPIE,$cc2003.
300 $axi, 524 p. :$bill. (some col.) ;$c28 cm.
440 0 $aProceedings of SPIE--the International Society for Optical Engineering,$x0277-786X ;$vv. 5073
504 $aIncludes bibliographical references and index.
650 0 $aThermography$vCongresses.
650 0 $aThermography$xIndustrial applications$vCongresses.
650 0 $aNondestructive testing$vCongresses.
700 1 $aCramer, K. Elliott.
700 1 $aMaldague, Xavier,$d1959-
710 2 $aSociety of Photo-optical Instrumentation Engineers.
994 $aZ0$bUTO
949 $aTA1570 .I59 2003$wLC$c1$i31761061684197$d15/5/2004$e29/4/2004$lSTACKS$mENGI_CSCI$n3$rY$sY$tBOOK$u12/3/2004