| Record ID | ia:tutorialvlsitest0000unse |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/tutorialvlsitest0000unse/tutorialvlsitest0000unse_marc.xml |
| Download MARC binary | https://www.archive.org/download/tutorialvlsitest0000unse/tutorialvlsitest0000unse_meta.mrc |
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003 OCoLC
005 20201014112236.0
008 850621s1985 dcua b 001 0 eng
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050 04 $aTK7874$b.T8855 1985
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245 00 $aTutorial--VLSI testing & validation techniques /$c[compiled by] Hassan K. Reghbati.
246 3 $aVLSI testing & validation techniques
246 3 $aTutorial--VLSI texting and validation techniques
260 $aWashington, D.C. :$bIEEE Computer Society Press ;$aLos Angeles, CA :$bOrder from IEEE Computer Society,$c1985.
300 $aix, 603 pages :$billustrations ;$c28 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
338 $avolume$bnc$2rdacarrier
500 $a"IEEE catalog number EH0237-8."
504 $aIncludes bibliographical references and indexes.
530 $aAlso issued online.
650 0 $aIntegrated circuits$xVery large scale integration$xTesting.
650 6 $aCircuits intégrés à très grande échelle$xEssais.
650 7 $aIntegrated circuits$xVery large scale integration$xTesting.$2fast$0(OCoLC)fst00975618
650 7 $aCAD$2gnd
650 7 $aPrüftechnik$2gnd
650 7 $aVLSI$2gnd
650 07 $aCAD.$2swd
700 1 $aReghbati, Hassan K.,$d1949-
776 08 $iOnline version:$tTutorial--VLSI testing & validation techniques.$dWashington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1985$w(OCoLC)560623195
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