| Record ID | marc_binghamton_univ/bgm_openlib_final_10-15.mrc:146636713:1272 |
| Source | Binghamton University |
| Download Link | /show-records/marc_binghamton_univ/bgm_openlib_final_10-15.mrc:146636713:1272?format=raw |
LEADER: 01272nam 2200313 a 4500
001 BIN01-001134399
005 20070802175754.0
007 heuamb024bbca
007 heubmb024baaa
007 heuamb024baba
008 941109s1990 nyua btb s000 0 eng d
035 $a(OCoLC)ocm31433108
035 9 $aAFB4676$bSB
040 $aXBM$cXBM$dNY$
049 $aBNGG
086 0 $aSTA,472-4,APPDS,91-40283$2nydocs
100 1 $aChakravarty, Sreejit.
245 13 $aAn approach to designing stuck-open testable CMOS combinational circuit$h[microform] /$cSreejit Chakravarty.
260 $aBuffalo, N.Y. :$bState University of New York at Buffalo, Dept. of Computer Science,$c[1990].
300 $a29 p. :$bill. ;$c28 cm.
440 0 $aTechnical report (State University of New York at Buffalo. Dept. of Computer Science) ;$v90-01
500 $a"February 1990."
504 $aIncludes bibliographical references.
510 4 $aChecklist of official publications of the State of New York,$c1990.
533 $aMicrofiche.$bAlbany, N.Y. :$cNew York State Library, filmed by AMTEK Corporation,$d1994.$e1 microfiche.
650 0 $aElectronic circuits$xTesting.
776 1 $cOriginal$w(OCoLC)23982013
852 40 $aBIN$bBINGO$cMNYSM$jSTA 472-4 APPDS 91-40283$91
945 $d05/14/97$nslo