| Record ID | marc_columbia/Columbia-extract-20221130-001.mrc:137760351:1524 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-001.mrc:137760351:1524?format=raw |
LEADER: 01524cam a2200373 i 4500
001 110603
005 20220518200355.0
008 821022s1980 gw a b 000 0 eng
010 $a 80027976
020 $a0387102744 (U.S. : pbk.)
035 $a(OCoLC)7171694
035 $a(OCoLC)ocm07171694
035 $a(CStRLIN)NYCG82-B53303
035 $9AAM7717CU
035 $a(NNC)110603
035 $a110603
050 00 $aQA76.9.F38$bO78
082 0 $a621.3819/52$219
090 $aQA76.9.F38$bO78
100 1 $aOsaki, Shunji.$0http://id.loc.gov/authorities/names/n80165257
245 10 $aReliability evaluation of some fault-tolerant computer architectures /$cShunji Osaki, Toshihiko Nishio.
260 $aBerlin ;$aNew York :$bSpringer-Verlag,$c1980.
300 $avi, 129 pages :$billustrations ;$c24 cm.
336 $atext$2rdacontent
337 $aunmediated$2rdamedia
338 $avolume$2rdacarrier
490 1 $aLecture notes in computer science ;$v97
500 $aErrata slip inserted.
504 $aBibliography: p. [127]-129.
650 0 $aFault-tolerant computing.$0http://id.loc.gov/authorities/subjects/sh85047488
650 0 $aElectronic digital computers$xReliability.$0http://id.loc.gov/authorities/subjects/sh85042322
700 1 $aNishio, Toshihiko,$d1954-$eauthor.$4http://id.loc.gov/vocabulary/relators/aut$0http://id.loc.gov/authorities/names/n80165073
830 0 $aLecture notes in computer science ;$v97.$0http://id.loc.gov/authorities/names/n42015162
852 00 $boff,eng$hQA76.9.F38$iO78