| Record ID | marc_columbia/Columbia-extract-20221130-001.mrc:421536671:2046 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-001.mrc:421536671:2046?format=raw |
LEADER: 02046cam a2200409 a 4500
001 336802
005 20220519002740.0
008 850423t19841984nyua b 101 0 eng
010 $a 84018100
020 $a030641838X
035 $a(OCoLC)11187686
035 $a(OCoLC)ocm11187686
035 $a(CStRLIN)NYCG85-B40183
035 $9ABM2936CU
035 $a(NNC)336802
035 $a336802
040 $dCStRLIN
050 00 $aTA417.25$b.F73 1983
082 0 $a620.1/1272$219
090 $aTA417.25$b.F73 1983
111 2 $aFrance-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science$d(1983 :$cSnowmass Village, Colo.)$0http://id.loc.gov/authorities/names/n84146485
245 10 $aApplications of x-ray topographic methods to materials science /$cedited by Sigmund Weissmann, Françoise Balibar, and Jean-François Petroff.
260 $aNew York :$bPlenum Press,$c[1984], ©1984.
300 $axiii, 536 pages :$billustrations ;$c26 cm
336 $atext$2rdacontent
337 $aunmediated$2rdamedia
338 $avolume$2rdacarrier
500 $a"Based on the proceedings of the France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science, held August 7-10, 1983, in Snowmass Village, Colorado, which was sponsored jointly by CNRS and NSF"--T.p. verso.
504 $aIncludes bibliographies and index.
650 0 $aRadiography, Industrial$vCongresses.
650 0 $aX-rays$xIndustrial applications$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008124340
700 1 $aWeissmann, Sigmund.$0http://id.loc.gov/authorities/names/n84120487
700 1 $aBalibar, Françoise.$0http://id.loc.gov/authorities/names/n84120488
700 1 $aPetroff, Jean-François.$0http://id.loc.gov/authorities/names/n84120489
710 2 $aCentre national de la recherche scientifique (France)$0http://id.loc.gov/authorities/names/n79049545
710 2 $aNational Science Foundation (U.S.)$0http://id.loc.gov/authorities/names/n79005681
852 00 $boff,eng$hTA417.25$i.F73 1983