| Record ID | marc_columbia/Columbia-extract-20221130-001.mrc:523006062:1209 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-001.mrc:523006062:1209?format=raw |
LEADER: 01209sam a2200361 a 4500
001 419448
005 20220519015741.0
007 hd afa---buca
008 861028s1986 xx a ab 000 0 eng d
035 $a(OCoLC)80105170
035 $a(OCoLC)ocm80105170
035 $a(CStRLIN)NYCG86-B115454
035 $9ABV8098CU
035 $a(NNC)419448
035 $a419448
040 $aNNC$cNNC
100 1 $aEvans, Howard Lee.
245 10 $aMeasurement of Schottky barrier interface states /$cHoward Lee Evans.
260 $c1986.
300 $aviii, 219 leaves, bound :$billustrations ;$c29 cm
336 $atext$2rdacontent
337 $amicroform$2rdamedia
338 $amicrofilm reel$2rdacarrier
500 $aTypescript (photocopy).
502 $aThesis (Ph. D.)--Columbia University, 1986.
504 $aIncludes bibliographical references.
533 $aMicrofilm.$bAnn Arbor, Mich. :$cUniversity Microfilms International,$d1986.$e1 microfilm reel. 35 mm.
500 $a"86-10,756."
650 0 $aDiodes, Schottky-barrier.
650 0 $aMetal insulator semiconductors.
650 0 $aInterface circuits.
650 0 $aSchottky barrier interface States.
852 80 $boff,mrr$kMICROFLM$hFC86-$i10,756